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Cited article:

Intellectual fitting of hard X-ray resonant reflectance maps obtained for low-contrast oxide multilayers across L absorption edges of Eu and Gd

P.A. Dvortsova, A.M. Korovin and S.M. Suturin
Materials Today Communications 41 110456 (2024)
https://doi.org/10.1016/j.mtcomm.2024.110456