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Automation of S-parameters measurements of high-power microwave transistors in a contact device with tunable strip matching circuits

Vladimir Evseev, Mikhail Ivlev, Elena Lupanova, Sergey Nikulin, Vitaliy Petrov and Andrey Terentyev

ITM Web Conf., 30 (2019) 11002

DOI: https://doi.org/10.1051/itmconf/20193011002

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