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The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon

V.P. Belichenko, A.S. Zapasnoy, A.S. Mironchev, A.V. Klokov and E.V. Matvievskiy

ITM Web Conf., 30 (2019) 15025

DOI: https://doi.org/10.1051/itmconf/20193015025

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