The design and testing issues of radiation tolerant microwave amplifiers implemented in the domestic GaAs pHEMT 0.5 μm processDenis Sotskov, Alexander Kuznetsov, Nikolay Usachev, Vadim Elesin and Ilya SelishchevITM Web Conf., 30 (2019) 10001DOI: https://doi.org/10.1051/itmconf/20193010001