| Issue |
ITM Web Conf.
Volume 65, 2024
International Conference on Multidisciplinary Approach in Engineering, Technology and Management for Sustainable Development: A Roadmap for Viksit Bharat @ 2047 (ICMAETM-24)
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|---|---|---|
| Article Number | 04004 | |
| Number of page(s) | 8 | |
| Section | Electricals and Electronics Engineering | |
| DOI | https://doi.org/10.1051/itmconf/20246504004 | |
| Published online | 16 July 2024 | |
Investigation on Optical Properties of Silar-Grown Highly Oriented Lead Sulphide (PbS) Thin Films
1 Lecturer in Physics, Applied Science & Humanities, Government polytechnic, Waghai-Dang, Gujarat Technological university, Ahmedabad, Chandkheda, Gujarat- India
2 Assistant Professor in applied Science & Humanities, Sankalchand Patel University, Visnagar, Gujarat-India.
3 Assistant Professor, SRICT-ISR, UPL University of Sustainable Technology, Ankleshwar, Gujarat-India.
1 E-mail: gamit.chandu@gmail.com
2* E-mail: India@vikasbhavsar@gmail.com
3 E-mail: p.trupti9@gmail.com
Using lead nitrate, thiourea, as well as sodium hydroxide as chemical precursors, the lead sulphide powder was formed at room temperatures and (PbS), at a given room temperature thin film were deposited on a glass substrate using the (SILAR) method at varying numbers of cycles. The optical studies for powder form and thin films were performed by UV-VI diffuse reflectance spectrophotometer-3600 SHIMADZU and UV-VIS-NIR Spectrophotometry. It was discovered that the PbS powder form as well as thin films produced under ideal deposition circumstances were polycrystalline with a face-centered cubic structure. Optical studies for powder form and thin films were carried out using a UV-VI spectrometer and it revealed the existence of direct bandgap for powder form is 1.69 eV and for thin films values in the ranges of (1.45-2.32) eV.
Key words: Lead Sulphide / thin films / SILAR / UV-VIS spectrophotometry-bandgap
© The Authors, published by EDP Sciences, 2024
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