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Cited article:

Predictor of reliability indicators for nanoelectronic heterostructure devices with transverse current transfer under conditions of limited experimental information based on Bayesian inversion

N A Vetrova, A A Filyaev, V D Shashurin and L A Luneva
Journal of Physics: Conference Series 2056 (1) 012051 (2021)
https://doi.org/10.1088/1742-6596/2056/1/012051