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Cited article:

MADA-Unet: MultiRes-scale attentive dense-aggregating Unet for worst-case transient IR-drop prediction

Yuanfa Ji, Mingfeng Zhong, Xiyan Sun, Furong Jiang and Qiang Fu
Microelectronics Journal 171 107097 (2026)
https://doi.org/10.1016/j.mejo.2026.107097

Pantha Protim Sarker, Tianze Kan, Jingchen Liang, Ozgur Tuncer, Bo He, Zelin Lu, Sudarshan Mallu, Lang Lin, Norman Chang, Riku Hasegawa, Kazuki Monta, Makoto Nagata, Farimah Farahmandi and Mark Tehranipoor
57 (2025)
https://doi.org/10.1109/HOST64725.2025.11050050

Artificial Neural Network Based Prediction Model for IR Drop Measurement in a VLSI Power Delivery Network

Amit Mondal and Tuhina Samanta
Journal of Electronic Testing 41 (3) 387 (2025)
https://doi.org/10.1007/s10836-025-06174-6