ITM Web of Conferences

Evaluation of accuracy of SiC-JFET macromodel

Kamil Bargieł and Damian Bisewski

ITM Web Conf., 19 (2018) 01027

Published online: 21 September 2018

DOI: 10.1051/itmconf/20181901027

Kamil Bargieł

Damian Bisewski

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