ITM Web of Conferences

Using probabilistic fuzzy models for the prediction of functional failures of microwave LSI with radiation exposure

Vyacheslav Barbashov, Nikolai Trushkin and Aleksei Osipov

ITM Web Conf., 30 (2019) 10003

Published online: 27 November 2019

DOI: 10.1051/itmconf/20193010003

Vyacheslav Barbashov

Nikolai Trushkin

Aleksei Osipov

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