ITM Web Conf.
Volume 30, 201929th International Crimean Conference “Microwave & Telecommunication Technology” (CriMiCo’2019)
|Number of page(s)||7|
|Section||Resistance to Radiation & Electromagnetic-Pulse Damages (6a)|
|Published online||27 November 2019|
Using probabilistic fuzzy models for the prediction of functional failures of microwave LSI with radiation exposure
National Research Nuclear University "MEPHI", 115409 Moscow, Russia
* Corresponding author: VMBarbashov@mephi.ru
The article presents an analysis of microwave LSI behavior under radiation exposure at the functional-logical level of description. The analysis is based on fuzzy digital automaton and topological probabilistic models of workability assessment. It is shown that in certain cases both deterministic and non-deterministic failures are typical. Each operation threshold in logic elements under radiation influence has a zone of uncertainty and can be expressed quantitatively by a fuzzy number. This case, the real nature of microwave LSI radiation behavior is determined by the specific ratio of radiation-sensitive parameters of its elements and by taking into account the influence of their statistical scatter. Methods are proposed for simulating failures of microwave LSI under radiation exposure that are based on the model of a fuzzy digital Brauer automaton and a probabilistic reliability automaton.
© The Authors, published by EDP Sciences, 2019
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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