Open Access
Issue
ITM Web Conf.
Volume 30, 2019
29th International Crimean Conference “Microwave & Telecommunication Technology” (CriMiCo’2019)
Article Number 10003
Number of page(s) 7
Section Resistance to Radiation & Electromagnetic-Pulse Damages (6a)
DOI https://doi.org/10.1051/itmconf/20193010003
Published online 27 November 2019
  1. Frank M.J., Associativity in a class of operations on spaces of distribution functions Aeguationes Math v. 12, pp. 121-144 (1975) [Google Scholar]
  2. V.M. Barbashov, N.S. Trushkin, Evaluation performance of digital integrated circuits while exposed to radiation, IOP Conf. Ser .: Mater. Sci. Eng. 151 012011 (2016) [CrossRef] [Google Scholar]
  3. V.M. Barbashov, B.I. Podlepetsky, N.S. Trushkin, Simulation of the radiation reliability of digital devices at the functional and logical level, Sensors and systems, v. 4, pp. 54-57 (2016) [Google Scholar]
  4. Gretzer G., General theory of lattices M, Mir, 456 p (1982). [Google Scholar]
  5. Yager R.R. Fuzzy sets and theory of possibilities (M ., Radio and communication (1982) [Google Scholar]
  6. Pospelov D.A., Fuzzy sets in control and artificial intelligence models (M., Science, 1986) [Google Scholar]
  7. Denisenko V.V., Compact models of MOS transistors for SPICE in micro- and nanoelectronics (M ., FIZMATLIT, 2010) [Google Scholar]
  8. V.M. Barbashov, N.S. Trushkin, Functional and logical modeling of the quality of functioning of the IC under the influence of radiation and electromagnetic radiation, Microelectronics, v. 38 (1), pp. 34-47 (2009) [Google Scholar]
  9. A.V. Sogoyan, A.I. Chumakov, A.Yu. Nikiforov Method for Predicting CMOS Parameter Degradation Due to Ionizing Radiation with Regard to Operating Time and Conditions, Russian Microelectronics, v. 28(4). pp. 224-235 (1999) [Google Scholar]
  10. V. M. Barbashov, N.S. Trushkin and O. A. Kalashnikov, Deterministic and nondeterministic failure models of LSI circuits exposed to radiation, Russian Microelectronics, v. 44(5), pp. 312-315 (2015) [CrossRef] [Google Scholar]
  11. А. V. Sogoyan, and V. A. Polunin, A model for the formation of leakage currents in the dielectrics of MOS structures under the effect of heavy charged particles, Russian Microelectronics, v. 44(1), pp. 54-59 (2015) [CrossRef] [Google Scholar]

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