Issue |
ITM Web Conf.
Volume 7, 2016
3rd Annual International Conference on Information Technology and Applications (ITA 2016)
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Article Number | 09023 | |
Number of page(s) | 5 | |
Section | Session 9: Computer Science and its Applications | |
DOI | https://doi.org/10.1051/itmconf/20160709023 | |
Published online | 21 November 2016 |
Research On The Measure Method Of Oblique Pinhole Parameters
School of Mechanical Engineering, University of Jinan, China
a Corresponding author: me-mayz@ujn.cn
There are many special advantages in measuring the diameter of blind and deep holes with a capacitive probe, there are still some challenges for the measurement of a oblique pinhole parameters because the measuring device is inconvenient to stretch into the oblique pinhole exactly. A five-dimensional measurement system was adopted in the paper which included a capacitive sensor probe and a three-coordinate measuring machine to accomplish the measurement for oblique pinholes. With the help of the three-dimensional coordinates measured from the pinhole axis, we put forward a comprehensive method of combining the projection method and the least squares method together for fitting spatial straight line to obtain the optimal equation of the spacial axis. Finally, a reliable and entire measurement system was set up.
© Owned by the authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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