ITM Web Conf.
Volume 30, 201929th International Crimean Conference “Microwave & Telecommunication Technology” (CriMiCo’2019)
|Number of page(s)||5|
|Section||Solid State and Microwave Devices (1)|
|Published online||27 November 2019|
An assessment of automated extraction capabilities for small-signal modeling of various GaAs pHEMT processes
Tomsk State University of Control Systems and Radioelectronics, 634050 Tomsk, Russia
* Corresponding author: email@example.com
A new automated small-signal GaAs pHEMT model extraction technique based on the analytical approach followed by optimization is suggested. The performance capability of the technique is confirmed by successful small-signal modeling of pHEMTs manufactured by different semiconductor fabs.
© The Authors, published by EDP Sciences, 2019
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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