| Issue |
ITM Web Conf.
Volume 30, 2019
29th International Crimean Conference “Microwave & Telecommunication Technology” (CriMiCo’2019)
|
|
|---|---|---|
| Article Number | 07001 | |
| Number of page(s) | 9 | |
| Section | Materials and Technology of Microwave Devices (5a) | |
| DOI | https://doi.org/10.1051/itmconf/20193007001 | |
| Published online | 27 November 2019 | |
Estimation of losses per unit length in a rectangular waveguide with rough screening surfaces based on the concept of partial waves
1 Nizhny Novgorod State Technical University n.a. R.E. Alekseev, Minin St., 24, Nizhny Novgorod, 603950, Russia
2 Branch of Federal State Unitary Enterprise “Russian Federal Nuclear Center-All-Russian Research Institute of Experimental Physics” “Research Institute of Measuring Systems n. a. Yu.Ye. Sedakov”, Tropinin St., 47, Nizhny Novgorod, 603137, Russia
* Corresponding author: birukovvv@mail.ru
A method for calculating the rough surface reflection coefficient of an electromagnetic wave is proposed. It is shown that the screening surface roughness in waveguides is equivalent to a decrease in conductivity of these surfaces in comparison with values belonging to Schukin-Leontovich boundary conditions for completely smooth surfaces.
Examples of calculating the attenuation coefficient in the rectangular waveguide with rough screening surfaces in a terahertz frequency range are presented. The influence of the size and shape of the rough surface profile irregularities on the waveguide attenuation is studied.
© The Authors, published by EDP Sciences, 2019
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