ITM Web Conf.
Volume 30, 201929th International Crimean Conference “Microwave & Telecommunication Technology” (CriMiCo’2019)
|Number of page(s)||6|
|Section||Microwave Measurements (7)|
|Published online||27 November 2019|
Automation of S-parameters measurements of high-power microwave transistors in a contact device with tunable strip matching circuits
1 Arzamas Engineering Design Bureau LLC, 607220 Arzamas (Nizhny Novgorod region), Russia
2 Alekseev Nizhny Novgorod State Technical University, 603950 Nizhny Novgorod, Russia
3 Rapid Telecom Systems Labs LLC, 603104 Nizhny Novgorod, Russia
* Corresponding author: email@example.com
In the practice by microwave power transistor amplifiers developing, the variable load method is usually used to determine the impedances of matching circuits in the complex conjugate matching mode. This solution involves the use of expensive equipment - coaxial impedance tuners and contact devices for mounting transistors in low impedance strip lines. An even more complicated and expensive way is the concept of X- parameters, based on the use of unique measuring equipment - a non-linear vector network analyzer, and a simulator for non-linear circuits design. The article proposes an alternative solution adapted to the operation of the transistor in real conditions and allowing to design the output stages of microwave power amplifiers using analysis and optimization of linear electrical circuits. The essence of the proposed solution is to automate the measurement of non-linear S-parameters of high-power microwave transistors in a contact device with tunable strip matching circuits for various DC supply voltage, frequency and input power mode in case of continuous or pulse input signal. The nonlinear S-parameters of the contact device are measured using the method of spatially remote variable load in the frequency range, in which the line conditioning and the maximum output power are achieved. The minimum of the reflected wave amplitude and the maximum gain are reached using movable strip matching transformers. The S-parameters measured in the coaxial line are automatically recalculated to the physical boundaries of the transistor by registering the positions of the input and output strip transformers.
© The Authors, published by EDP Sciences, 2019
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