ITM Web Conf.
Volume 30, 201929th International Crimean Conference “Microwave & Telecommunication Technology” (CriMiCo’2019)
|Number of page(s)||4|
|Section||Microwave Measurements (7)|
|Published online||27 November 2019|
Automation of measurements permittivity of materials by the capacitor method
Tomsk State University, Faculty of Radiophysics, 36 Lenin Avenue, Tomsk 634050, Russian Federation
* Corresponding author: email@example.com
The article discusses an example of the automation of the process of measuring the dielectric constant of materials by the capacitor method using the LabVIEW graphical programming environment and the Agilent E4980A precision LCR meter. A description of the hardwaresoftware complex is presented, as well as the measurement results.
© The Authors, published by EDP Sciences, 2019
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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