ITM Web Conf.
Volume 47, 20222022 2nd International Conference on Computer, Communication, Control, Automation and Robotics (CCCAR2022)
|Number of page(s)||5|
|Section||Computer Science and System Design, Application|
|Published online||23 June 2022|
Research and development of public service platform for integrated circuit test
Zhejiang Fangyuan Test Group Co., Ltd, China
* Corresponding author: email@example.com
Integrated circuit (IC) test is a key technical part of IC chain, which works through the entire life cycle of IC design, manufacturing, packaging, and application. Based on the increasing requirements of IC test, this paper analyzes the breakthrough point to promote the development of IC test and puts forward an accurate and feasible programme of public test platform construction so as to achieve long-term sustainable development of IC industry.
Key words: Integrated circuit / Public service platform / IC test
© The Authors, published by EDP Sciences, 2022
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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