Open Access
ITM Web Conf.
Volume 47, 2022
2022 2nd International Conference on Computer, Communication, Control, Automation and Robotics (CCCAR2022)
Article Number 01020
Number of page(s) 5
Section Computer Science and System Design, Application
Published online 23 June 2022
  1. Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges Gielen. Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization [J]. Integration. 2016, (55): 393-400 [CrossRef] [Google Scholar]
  2. SenGupta B, Larsson E. Test Planning and Test Access Mechanism Design for Stacked Chips using ILP[C]. In: IEEE VLSI Test Symposium. 2014, 1-6 [Google Scholar]
  3. Breeta SenGupta, Dimitar Nikolov, Assmitra Dash, Erik Larsson. Test Flow Selection for Stacked Integrated Circuits [J]. Journal of Electronic Testing. 2019, (35): 425-440 [CrossRef] [Google Scholar]
  4. Agrawal M, Chakrabarty K. Test-Cost Modeling and Optimal Test-Flow Selection of 3-D-Stacked ICs[C]. In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2015, 1523-1536 [CrossRef] [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.