Open Access
| Issue |
ITM Web Conf.
Volume 7, 2016
3rd Annual International Conference on Information Technology and Applications (ITA 2016)
|
|
|---|---|---|
| Article Number | 02002 | |
| Number of page(s) | 5 | |
| Section | Session 2: Signal and Image Processing | |
| DOI | https://doi.org/10.1051/itmconf/20160702002 | |
| Published online | 21 November 2016 | |
- M. Rees, R. Condit, M. Crawley, S. Pacala and D. Tilman, Science 293, 5530 (2001) [CrossRef] [PubMed] [Google Scholar]
- M. G. Hu, J. F. Wang and Y. Ge, Sensors 9, 11 (2009) [Google Scholar]
- B. B. Mandelbrot and M. Aizenman, Phys. Today 32, 65 (1979) [CrossRef] [Google Scholar]
- Y. Xia, D. Feng and R. Zhao, IEEE Trans. Image Process. 15, 3 (2006) [CrossRef] [Google Scholar]
- Q. Guo, J. Shao, F. Guo and V. Ruiz, Int. J. Comput. Ass. Rad. 2 (2007) [Google Scholar]
- M. P. Bishop, J. F. ShroderJr, B. L. Hickman, and L. Copland, Geomorphology 21, 3 (1998) [CrossRef] [Google Scholar]
- W. Sun, G. Xu, P. Gong and S. Liang, Int. J. Remote. Sens. 27, 22 (2006) [Google Scholar]
- R. Lopes and N. Betrouni, Med. Image Anal. 13, 4 (2009) [Google Scholar]
- B. B. Chaudhuri and N. Sarkar, IEEE T. Pattern Anal. 17, 1 (1995) [CrossRef] [Google Scholar]
- A. P. Pentland, IEEE T. Pattern Anal. 6 (1984) [Google Scholar]
- S. Peleg, J. Naor, R. Hartley and D. Avnir, IEEE T. Pattern Anal. 4 (1984) [Google Scholar]
- Z. Zhou and Q. Bu, Yaogan Xuebao- J. Remote Sens. 15, 1 (2011) [Google Scholar]
- A. Savitzky and M. J. E. Golay, Anal. Chem. 36, 8 (1964) [Google Scholar]
- S. Zheng, J. Zheng, M. Shi, et al, Yaogan Xuebao- J. Remote Sens. 18, 4 (2014) [Google Scholar]
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.