Open Access
ITM Web Conf.
Volume 30, 2019
29th International Crimean Conference “Microwave & Telecommunication Technology” (CriMiCo’2019)
Article Number 07003
Number of page(s) 6
Section Materials and Technology of Microwave Devices (5a)
Published online 27 November 2019
  1. M. D. Janezic et. al., “Broadband Complex Permittivity Measurements of Dielectric Substrates using a Split-Cylinder Resonator”, IEEE MTT-S International Microwave Symposium Digest (2004) [Google Scholar]
  2. M. Kapoor, K.S. Daya, and G.S. Tyagi, “Coupled ring resonator for microwave characterization of dielectric materials.” Special Issue on Surveillance Systems for Air Navigation Services, vol. 4, no. 2, pp. 241-246 (April 2012) [Google Scholar]
  3. M. D. Janezic, J. A. Jargon, “Complex Permittivity Determination from Propagation Constant Measurements”, IEEE Microwave and Guided Wave Letters, vol. 9 (1999) [Google Scholar]
  4. J. Baker-Jarvis et. al., « Improved technique for determining complex permittivity with the transmission/reflection method », IEEE Transactions on Microwave Theory and Techniques, vol. 3 (1990) [Google Scholar]
  5. M.Y. Koledintseva et. al., “Improved experiment-based technique to characterize dielectric properties of printed circuit boards,” IEEE Trans. Electromag. Compat. (2013) [Google Scholar]
  6. A. Koul, M.Y. Koledintseva, et. al., “Differential extrapolation method for separating dielectric and rough conductor losses in printed circuit boards”, IEEE Trans. Electromag. Compat., vol. 54, no. 2, pp. 421-433 (Apr. 2012) [CrossRef] [Google Scholar]
  7. D.M. Pozar, Microwave Engineering, Wiley, 2nd ed. (1998) [Google Scholar]

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