Issue |
ITM Web Conf.
Volume 45, 2022
2021 3rd International Conference on Computer Science Communication and Network Security (CSCNS2021)
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Article Number | 01053 | |
Number of page(s) | 9 | |
Section | Computer Technology and System Design | |
DOI | https://doi.org/10.1051/itmconf/20224501053 | |
Published online | 19 May 2022 |
Analysis of polarization characteristics of freeform surface optical system
1
Changchun University of Science and Technology, State Key Laboratory of Applied Optics, National and Local Joint Engineering Research Center for Space Optoelectronics Technology, Changchun 130022, China
2
Changchun University of Science and Technology, College of Optoelectronic Engineering, Changchun 130022, China
* Corresponding author: cclgdxkjs@163.com
Freeform surfaces are widely used in off-axis optical systems with large aperture, large field of view, and long focal length. The polarization effect caused by the non-rotationally symmetrical shape has an impact on the system’s polarization imaging quality and measurement accuracy. Based on Jones’ notation, this paper proposes a polarization aberration analysis method for fringed Zernike polynomial freeform optical systems and constructs a full-field polarisation aberration analysis model of non-rotationally symmetric freeform reflective optical systems. The light propagation vector k is added on the basis of the two-dimensional ray tracing algorithm. By tracing the full-field polarized light of the off-axis optical system in the field of view, the Jones pupil diagram is obtained. The phase aberration, diattenuation and retardance are separated by Pauli decomposition and SVD decomposition. The off-axis freeform surface optical system is designed. The analysis results show that the phase aberration of the off-axis freeform surface optical system is directly related to the surface shape of the freeform surface. The changes of the freeform surface to the diattenuation and retardance are both 56% of the diattenuation and retardance of the sistem. For deep-space telescopes and lithography systems, it is of great significance for improving system accuracy to master this change.
Key words: Polarization aberration / Jones matrix / Freeform surface / Polarization ray tracing
© The Authors, published by EDP Sciences, 2022
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