Open Access
ITM Web Conf.
Volume 9, 2017
The 2016 International Conference Applied Mathematics, Computational Science and Systems Engineering
Article Number 01013
Number of page(s) 4
Section Applied Mathematics
Published online 09 January 2017
  1. A.R.R Adli, K.M.B Jansen. Microelectron Reliab 2016; 62: 26–38. [CrossRef]
  2. Y. Cengel, R. Turner. Fundamentals of Thermal-Fluid Sciences. (McGraw-Hill Higher Education, Singapore, 2001).
  3. D.B. Tuckerman, R.F.W. Pease. IEEE Electron Device Lett 1981; 2: 126–9. [CrossRef]
  4. C-B. Kim, C. Leng, X-D. Wang, T-H. Wang, W-M. Yan. Int J Heat Mass Transf 2015; 89: 838–45. [CrossRef]
  5. S.P. Jang, S.J. Kim, K.W. Paik. Sensors Actuators A 2003; 105: 211–24. [CrossRef]
  6. L.T. Yeh. J Electron Packag 1995; 117: 333. [CrossRef]
  7. R. Baby, C. Balaji Appl Therm Eng 2013; 54: 65–77. [CrossRef]
  8. R. Palanichamy, P. Nagaraj, S.M. Somasundaram. IUP J Mech Eng 2010; 3: 35–47.
  9. R. Kalbasi, M.R. Salimpour. Appl Therm Eng 2015; 84: 339–49. [CrossRef]
  10. F.P. Incropera, D.P. DeWitt, T.L. Bergman, S. Lavine Adrienne, Fundamentals of Heat and Mass Transfer (John Wiley & Sons Inc, United States, 2007).
  11. J.P. Holman. Heat transfer. (McGraw-Hill, London, 1992).
  12. J.H. Lienhard IV, LienhardJ.H. V. A Heat Transfer Textbook. (Philogiston Press, Cambridge, 2004).
  13. H. Nguyen, A. Aziz Wärme- und Stoffübertragung 1992; 27: 67–72. [CrossRef]
  14. R.G. Rice, D.D. Do. Applied mathematics and modeling for chemical engineers. (John Wiley & Sons, Inc, New Jersey, 2012).
  15. R.B. Bird, E.W. Stewart, N.E. Lightfoot. Transport Phenomena. (John Wiley & Sons, Inc, New York, 2002).

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.